Ultrafast Noise-Immune Short-Circuit Detection in Gallium Nitride Power Semiconductors via Drain-Source Voltage Pattern Recognition
2025 IEEE Energy Conversion Conference Congress and Exposition (ECCE)December 3, 2025DOI: 10.1109/ecce58356.2025.11259985
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Oiu, T., Zhang, Z., Das, A., & Zikpi, I. (2025). Ultrafast Noise-Immune Short-Circuit Detection in Gallium Nitride Power Semiconductors via Drain-Source Voltage Pattern Recognition. 2025 IEEE Energy Conversion Conference Congress and Exposition (ECCE). https://doi.org/10.1109/ecce58356.2025.11259985
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