J. S. Chawla

Unclaimed profile

🏛 Intel (United States)📍 US

This profile was assembled from public publication metadata. If this is you, claim it to manage your bio, add collaborators, and connect with the research community on Inested.

Claim this profile I already have an account

Publications

Determining the shape and periodicity of nanostructures using small‐angle X‐ray scattering
2015Cited 72×
View →
Evaluation of the effect of data quality on the profile uncertainty of critical dimension small angle x-ray scattering
2016Cited 24×
View →
Scanning electron microscope measurement of width and shape of 10nm patterned lines using a JMONSEL-modeled library.
Ultramicroscopy2015Cited 114×
View →