Cheryl Alix

Unclaimed profile

🏛 In-Q-Tel📍 US

This profile was assembled from public publication metadata. If this is you, claim it to manage your bio, add collaborators, and connect with the research community on Inested.

Claim this profile I already have an account

Publications

X-ray metrology of nanowire/ nanosheet FETs for advanced technology nodes
Advanced Lithography2020Cited 9×
View →