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| Ultrafast Noise-Immune Short-Circuit Detection in Gallium Nitride Power Semiconductors via Drain-Source Voltage Pattern Recognition Tian Oiu, Zheyu Zhang, Annoy Kumar Das, Israel Zikpi · 2025 IEEE Energy Conversion Conference Congress and Exposition (ECCE) | — | 2025 |
Annoy Kumar Das
Tian Oiu
Zheyu Zhang
